Author: L. W. Hobbs, K. H. Westmacott, D. B. Williams
Binding: Hardback
Publisher: Materials Research Society, 1986

Condition remarks:
Book: Good
Jacket: N/A
Pages: Good
Markings: No markings

This academic text presents a comprehensive guide to utilizing the Transmission Electron Microscope for advanced materials analysis. It instructs readers on the fundamental principles and practical applications of TEM, detailing its role in understanding material structures and properties at a microscopic level. The authors chronicle various methodologies and techniques essential for effective problem-solving in materials science. This authoritative work illustrates how TEM can be applied to diagnose material failures, characterize novel substances, and advance research in diverse engineering fields. It serves as an indispensable resource for students, researchers, and professionals seeking to master electron microscopy for materials characterization.